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VISAPP is part of VISIGRAPP, the 12th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications.
Registration to VISAPP allows free access to all other VISIGRAPP conferences.
 
The International Conference on Computer Vision Theory and Applications aims at becoming a major point of contact between researchers, engineers and practitioners on the area of computer vision application systems. Five simultaneous tracks will be held, covering all different aspects related to computer vision: Image Formation and Preprocessing; Image and Video Analysis and Understanding; Motion, Tracking and Stereo Vision; and Applications and Services.




Conference Chair

Jose BrazDepartamento De Sistemas e Informática, Escola Superior de Tecnologia de Setúbal, Portugal

PROGRAM CO-CHAIRS

Francisco ImaiApple Inc., United States
Alain TremeauUniversité Jean Monnet in Saint Etienne, France

ASSOCIATE CHAIRS

M. Emre Emre CelebiComputer Science, University of Central Arkansas, United States -Image Formation and Preprocessing
Raimondo SchettiniUniversity of Milano - Bicocca, Italy -Image and Video Analysis
Fabio GalassoDepartment of Computer Science, Sapienza University of Rome, Italy -Image and Video Understanding
Liang LinSun Yat-Sen University, China -Applications and Services
Zoltan KatoInstitute of Informatics, University of Szeged, Hungary -Motion, Tracking and Stereo Vision

Keynote Speakers

Jack van WijkEindhoven University of Technology, Netherlands
Holly RushmeierYale University, United States
Jean-Daniel FeketeINRIA, France
Nadia Magnenat-ThalmannMiralab, NTU, Singapore and MIRALab, University of Geneva, Switzerland

Workshops




 

All papers presented at the conference venue
will be available at the SCITEPRESS Digital Library


It is planned to publish a short list of revised and
extended versions of presented papers with Springer
in a CCIS Series book (final approval pending)

In Cooperation with:

AFIG   Eurographics  


Proceedings will be submitted for indexation by:

DBLP   Thomson   INSPEC   EI   SCOPUS  

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